Scanning Electron Microscope (SEM) and its accessories

The subject matter of the Public Contract is supply of scanning electron microscope (SEM) and its accessories (hereinafter “the device”). The device that is an instrument that allows imaging and analysis of samples by using focused electron beam as a mean for generation of signals from the observed sample that are then detected and processed into the comprehensive form by the device. The device is in detail specified in Annex No. 1- Technical specification and Annex no. 2 – Drawing of the Procurement Documentation that is published on the that is published on the Contracting Authority profile: https://e-zakazky.cz/profil-zadavatele/74e987e1-b4a1-4571-b8b6-2cd93fe6f932